Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis

Elisabetta Canetta, Ashok K. Adya

Research output: Contribution to journal › Article

  • 9 Citations

Abstract

Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs.
Original languageEnglish
Pages (from-to)16-25
Number of pages10
JournalForensic Science International
Volume210
Issue number1-3
DOIs
StatePublished - Jul 2011

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Atomic Force Microscopy
Adhesives
Crime
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Canetta, Elisabetta; Adya, Ashok K. / Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis.

In: Forensic Science International, Vol. 210, No. 1-3, 07.2011, p. 16-25.

Research output: Contribution to journal › Article

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abstract = "Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs.",
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Canetta, E & Adya, AK 2011, 'Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis' Forensic Science International, vol 210, no. 1-3, pp. 16-25. DOI: 10.1016/j.forsciint.2011.01.029

Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis. / Canetta, Elisabetta; Adya, Ashok K.

In: Forensic Science International, Vol. 210, No. 1-3, 07.2011, p. 16-25.

Research output: Contribution to journal › Article

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AU - Canetta,Elisabetta

AU - Adya,Ashok K.

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AB - Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs.

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Canetta E, Adya AK. Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis. Forensic Science International. 2011 Jul;210(1-3):16-25. Available from, DOI: 10.1016/j.forsciint.2011.01.029

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