Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden, W. Allan Gillespie, S. P. Jamison, E. A. Knabbe, Allan M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, P. Schmuser, B. Steffen

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    The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
    Original languageEnglish
    Article number164801
    JournalPhysical Review of Letters
    Issue number16
    Publication statusPublished - Oct 2007


    • Relativistic electron and positron beams
    • Free-electron lasers
    • Beam profile
    • Beam intensity


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