Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden, W. Allan Gillespie, S. P. Jamison, E. A. Knabbe, Allan M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, P. Schmuser, B. Steffen

Research output: Contribution to journalArticle

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Abstract

The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
Original languageEnglish
Article number164801
JournalPhysical Review of Letters
Volume99
Issue number16
StatePublished - Oct 2007

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electro-optics
electrons
x ray lasers
free electron lasers
charge distribution
shot
monitors
radio frequencies
detectors
profiles

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Berden, G., Gillespie, W. A., Jamison, S. P., Knabbe, E. A., MacLeod, A. M., van der Meer, A. F. G., ... Steffen, B. (2007). Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review of Letters, 99(16), [164801].

Berden, G.; Gillespie, W. Allan; Jamison, S. P.; Knabbe, E. A.; MacLeod, Allan M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Steffen, B. / Benchmarking of electro-optic monitors for femtosecond electron bunches.

In: Physical Review of Letters, Vol. 99, No. 16, 164801, 10.2007.

Research output: Contribution to journalArticle

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abstract = "The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.",
author = "G. Berden and Gillespie, {W. Allan} and Jamison, {S. P.} and Knabbe, {E. A.} and MacLeod, {Allan M.} and {van der Meer}, {A. F. G.} and Phillips, {P. J.} and H. Schlarb and B. Schmidt and P. Schmuser and B. Steffen",
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Berden, G, Gillespie, WA, Jamison, SP, Knabbe, EA, MacLeod, AM, van der Meer, AFG, Phillips, PJ, Schlarb, H, Schmidt, B, Schmuser, P & Steffen, B 2007, 'Benchmarking of electro-optic monitors for femtosecond electron bunches' Physical Review of Letters, vol 99, no. 16, 164801.

Benchmarking of electro-optic monitors for femtosecond electron bunches. / Berden, G.; Gillespie, W. Allan; Jamison, S. P.; Knabbe, E. A.; MacLeod, Allan M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Steffen, B.

In: Physical Review of Letters, Vol. 99, No. 16, 164801, 10.2007.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Benchmarking of electro-optic monitors for femtosecond electron bunches

AU - Berden,G.

AU - Gillespie,W. Allan

AU - Jamison,S. P.

AU - Knabbe,E. A.

AU - MacLeod,Allan M.

AU - van der Meer,A. F. G.

AU - Phillips,P. J.

AU - Schlarb,H.

AU - Schmidt,B.

AU - Schmuser,P.

AU - Steffen,B.

PY - 2007/10

Y1 - 2007/10

N2 - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.

AB - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.

M3 - Article

VL - 99

JO - Physical Review of Letters

T2 - Physical Review of Letters

JF - Physical Review of Letters

IS - 16

M1 - 164801

ER -

Berden G, Gillespie WA, Jamison SP, Knabbe EA, MacLeod AM, van der Meer AFG et al. Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review of Letters. 2007 Oct;99(16). 164801.