The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
|Journal||Physical Review of Letters|
|Publication status||Published - Oct 2007|
Berden, G., Gillespie, W. A., Jamison, S. P., Knabbe, E. A., MacLeod, A. M., van der Meer, A. F. G., Phillips, P. J., Schlarb, H., Schmidt, B., Schmuser, P., & Steffen, B. (2007). Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review of Letters, 99(16), .