Built-in self-test in intelligent microsystems as a contributor to system quality and performance

T. Olbrich, David A. Bradley, A. M. D. Richardson

    Research output: Contribution to journalArticlepeer-review

    8 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)601-613
    Number of pages13
    JournalQuality Engineering
    Volume8
    Issue number4
    DOIs
    Publication statusPublished - 1996

    Keywords

    • Microsystems
    • Smart sensors
    • Diagnosis
    • Quality
    • Self-test
    • Testability

    Cite this