| Original language | English |
|---|---|
| Pages (from-to) | 601-613 |
| Number of pages | 13 |
| Journal | Quality Engineering |
| Volume | 8 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1996 |
Cite this
Olbrich, T., Bradley, D. A., & Richardson, A. M. D. (1996). Built-in self-test in intelligent microsystems as a contributor to system quality and performance. Quality Engineering, 8(4), 601-613. DOI: 10.1080/08982119608904671
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journal = "Quality Engineering",
issn = "0898-2112",
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}
Olbrich, T, Bradley, DA & Richardson, AMD 1996, 'Built-in self-test in intelligent microsystems as a contributor to system quality and performance' Quality Engineering, vol 8, no. 4, pp. 601-613. DOI: 10.1080/08982119608904671
Built-in self-test in intelligent microsystems as a contributor to system quality and performance. / Olbrich, T.; Bradley, David A.; Richardson, A. M. D.
In: Quality Engineering, Vol. 8, No. 4, 1996, p. 601-613.Research output: Contribution to journal › Article
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AU - Bradley,David A.
AU - Richardson,A. M. D.
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DO - 10.1080/08982119608904671
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VL - 8
SP - 601
EP - 613
JO - Quality Engineering
T2 - Quality Engineering
JF - Quality Engineering
SN - 0898-2112
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Olbrich T, Bradley DA, Richardson AMD. Built-in self-test in intelligent microsystems as a contributor to system quality and performance. Quality Engineering. 1996;8(4):601-613. Available from, DOI: 10.1080/08982119608904671