Original language | English |
---|---|
Pages (from-to) | 601-613 |
Number of pages | 13 |
Journal | Quality Engineering |
Volume | 8 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1996 |
Built-in self-test in intelligent microsystems as a contributor to system quality and performance
T. Olbrich, David A. Bradley, A. M. D. Richardson
Research output: Contribution to journal › Article › peer-review
8
Citations
(Scopus)