Built-in self-test in intelligent microsystems as a contributor to system quality and performance

T. Olbrich, David A. Bradley, A. M. D. Richardson

Research output: Contribution to journalArticle

  • 6 Citations
Original languageEnglish
Pages (from-to)601-613
Number of pages13
JournalQuality Engineering
Volume8
Issue number4
DOIs
StatePublished - 1996

Cite this

Olbrich, T.; Bradley, David A.; Richardson, A. M. D. / Built-in self-test in intelligent microsystems as a contributor to system quality and performance.

In: Quality Engineering, Vol. 8, No. 4, 1996, p. 601-613.

Research output: Contribution to journalArticle

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author = "T. Olbrich and Bradley, {David A.} and Richardson, {A. M. D.}",
year = "1996",
doi = "10.1080/08982119608904671",
volume = "8",
pages = "601--613",
journal = "Quality Engineering",
issn = "0898-2112",
publisher = "Taylor and Francis Ltd.",
number = "4",

}

Built-in self-test in intelligent microsystems as a contributor to system quality and performance. / Olbrich, T.; Bradley, David A.; Richardson, A. M. D.

In: Quality Engineering, Vol. 8, No. 4, 1996, p. 601-613.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Built-in self-test in intelligent microsystems as a contributor to system quality and performance

AU - Olbrich,T.

AU - Bradley,David A.

AU - Richardson,A. M. D.

PY - 1996

Y1 - 1996

U2 - 10.1080/08982119608904671

DO - 10.1080/08982119608904671

M3 - Article

VL - 8

SP - 601

EP - 613

JO - Quality Engineering

T2 - Quality Engineering

JF - Quality Engineering

SN - 0898-2112

IS - 4

ER -