Built-in self-test in intelligent microsystems as a contributor to system quality and performance

T. Olbrich, David A. Bradley, A. M. D. Richardson

Research output: Contribution to journal › Article › peer-review

Keywords

@article{8cb0c18b6cc34ea5bb00577ccef56495,

title = "Built-in self-test in intelligent microsystems as a contributor to system quality and performance",

author = "T. Olbrich and Bradley, {David A.} and Richardson, {A. M. D.}",

year = "1996",

doi = "10.1080/08982119608904671",

language = "English",

volume = "8",

pages = "601--613",

journal = "Quality Engineering",

issn = "0898-2112",

publisher = "Taylor and Francis Ltd.",

number = "4",

}

TY - JOUR

T1 - Built-in self-test in intelligent microsystems as a contributor to system quality and performance

AU - Olbrich, T.

AU - Bradley, David A.

AU - Richardson, A. M. D.

PY - 1996

Y1 - 1996

U2 - 10.1080/08982119608904671

DO - 10.1080/08982119608904671

M3 - Article

VL - 8

SP - 601

EP - 613

JO - Quality Engineering

JF - Quality Engineering

SN - 0898-2112

IS - 4

ER -