| Original language | English |
|---|---|
| Pages (from-to) | 601-613 |
| Number of pages | 13 |
| Journal | Quality Engineering |
| Volume | 8 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1996 |
Cite this
Olbrich, T., Bradley, D. A., & Richardson, A. M. D. (1996). Built-in self-test in intelligent microsystems as a contributor to system quality and performance. Quality Engineering, 8(4), 601-613. https://doi.org/10.1080/08982119608904671
@article{8cb0c18b6cc34ea5bb00577ccef56495,
title = "Built-in self-test in intelligent microsystems as a contributor to system quality and performance",
author = "T. Olbrich and Bradley, {David A.} and Richardson, {A. M. D.}",
year = "1996",
doi = "10.1080/08982119608904671",
language = "English",
volume = "8",
pages = "601--613",
journal = "Quality Engineering",
issn = "0898-2112",
publisher = "Taylor and Francis Ltd.",
number = "4",
}
Olbrich, T, Bradley, DA & Richardson, AMD 1996, 'Built-in self-test in intelligent microsystems as a contributor to system quality and performance', Quality Engineering, vol. 8, no. 4, pp. 601-613. https://doi.org/10.1080/08982119608904671
Built-in self-test in intelligent microsystems as a contributor to system quality and performance. / Olbrich, T.; Bradley, David A.; Richardson, A. M. D.
In: Quality Engineering, Vol. 8, No. 4, 1996, p. 601-613.Research output: Contribution to journal › Article
TY - JOUR
T1 - Built-in self-test in intelligent microsystems as a contributor to system quality and performance
AU - Olbrich, T.
AU - Bradley, David A.
AU - Richardson, A. M. D.
PY - 1996
Y1 - 1996
U2 - 10.1080/08982119608904671
DO - 10.1080/08982119608904671
M3 - Article
VL - 8
SP - 601
EP - 613
JO - Quality Engineering
JF - Quality Engineering
SN - 0898-2112
IS - 4
ER -
Olbrich T, Bradley DA, Richardson AMD. Built-in self-test in intelligent microsystems as a contributor to system quality and performance. Quality Engineering. 1996;8(4):601-613. https://doi.org/10.1080/08982119608904671