Built-in self-test in intelligent microsystems as a contributor to system quality and performance

T. Olbrich, David A. Bradley, A. M. D. Richardson

Research output: Contribution to journalArticle

8 Citations (Scopus)
Original languageEnglish
Pages (from-to)601-613
Number of pages13
JournalQuality Engineering
Volume8
Issue number4
DOIs
Publication statusPublished - 1996

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