Built-in self-test in intelligent microsystems as a contributor to system quality and performance

  • T. Olbrich
  • , David A. Bradley
  • , A. M. D. Richardson

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)601-613
    Number of pages13
    JournalQuality Engineering
    Volume8
    Issue number4
    DOIs
    Publication statusPublished - 1996

    Keywords

    • Microsystems
    • Smart sensors
    • Diagnosis
    • Quality
    • Self-test
    • Testability

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