Original language | English |
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Pages (from-to) | 777-780 |
Number of pages | 4 |
Journal | The Scientific World Journal |
Volume | 6 |
DOIs | |
Publication status | Published - 6 Jul 2006 |
Keywords
- AFM
- Atomic force microscopy
- Microbiology
- Environmental stress
- Yeasts
- Morphology
- Saccharomyces cerevisiae
- Schizosaccharomyces pombe