| Original language | English |
|---|---|
| Pages (from-to) | 777-780 |
| Number of pages | 4 |
| Journal | The Scientific World Journal |
| Volume | 6 |
| DOIs | |
| Publication status | Published - 6 Jul 2006 |
Keywords
- AFM
- Atomic force microscopy
- Microbiology
- Environmental stress
- Yeasts
- Morphology
- Saccharomyces cerevisiae
- Schizosaccharomyces pombe