Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden; S. P. Jamison; Allan M. MacLeod; W. Allan Gillespie; B. Redlich; A. F. G. van der Meer

doi:10.1103/PhysRevLett.93.114802

Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden, S. P. Jamison, Allan M. MacLeod, W. Allan Gillespie, B. Redlich, A. F. G. van der Meer

Abertay University

Research output: Contribution to journal › Article › peer-review

160 Citations (Scopus)

Abstract

Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.

Original language	English
Article number	114802
Journal	Physical Review Letters
Volume	93
Issue number	11
DOIs	https://doi.org/10.1103/PhysRevLett.93.114802
Publication status	Published - Sep 2004

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10.1103/PhysRevLett.93.114802

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title = "Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles",

abstract = "Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.",

author = "G. Berden and Jamison, {S. P.} and MacLeod, {Allan M.} and Gillespie, {W. Allan} and B. Redlich and {van der Meer}, {A. F. G.}",

year = "2004",

month = sep,

doi = "10.1103/PhysRevLett.93.114802",

language = "English",

volume = "93",

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Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. / Berden, G.; Jamison, S. P.; MacLeod, Allan M.; Gillespie, W. Allan; Redlich, B.; van der Meer, A. F. G.

In: Physical Review Letters, Vol. 93, No. 11, 114802, 09.2004.

Research output: Contribution to journal › Article › peer-review

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T1 - Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

AU - Berden, G.

AU - Jamison, S. P.

AU - MacLeod, Allan M.

AU - Gillespie, W. Allan

AU - Redlich, B.

AU - van der Meer, A. F. G.

PY - 2004/9

Y1 - 2004/9

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AB - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.

U2 - 10.1103/PhysRevLett.93.114802

DO - 10.1103/PhysRevLett.93.114802

M3 - Article

VL - 93

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 11

M1 - 114802

ER -

Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

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