Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden, S. P. Jamison, Allan M. MacLeod, W. Allan Gillespie, B. Redlich, A. F. G. van der Meer

    Research output: Contribution to journalArticlepeer-review

    169 Citations (Scopus)

    Abstract

    Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.
    Original languageEnglish
    Article number 114802
    JournalPhysical Review Letters
    Volume93
    Issue number11
    DOIs
    Publication statusPublished - Sep 2004

    Keywords

    • Electron beams

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