Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden, S. P. Jamison, Allan M. MacLeod, W. Allan Gillespie, B. Redlich, A. F. G. van der Meer

Research output: Contribution to journalArticle

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Abstract

Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.
Original languageEnglish
Article number 114802
JournalPhysical Review Letters
Volume93
Issue number11
DOIs
StatePublished - Sep 2004

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electrons
electro-optics
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time measurement

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Berden, G., Jamison, S. P., MacLeod, A. M., Gillespie, W. A., Redlich, B., & van der Meer, A. F. G. (2004). Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. Physical Review Letters, 93(11), [ 114802]. DOI: 10.1103/PhysRevLett.93.114802

Berden, G.; Jamison, S. P.; MacLeod, Allan M.; Gillespie, W. Allan; Redlich, B.; van der Meer, A. F. G. / Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles.

In: Physical Review Letters, Vol. 93, No. 11, 114802, 09.2004.

Research output: Contribution to journalArticle

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abstract = "Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.",
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Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. / Berden, G.; Jamison, S. P.; MacLeod, Allan M.; Gillespie, W. Allan; Redlich, B.; van der Meer, A. F. G.

In: Physical Review Letters, Vol. 93, No. 11, 114802, 09.2004.

Research output: Contribution to journalArticle

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AU - Jamison,S. P.

AU - MacLeod,Allan M.

AU - Gillespie,W. Allan

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AU - van der Meer,A. F. G.

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DO - 10.1103/PhysRevLett.93.114802

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