Abstract
| Original language | English |
|---|---|
| Article number | 114802 |
| Journal | Physical Review Letters |
| Volume | 93 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - Sep 2004 |
Fingerprint
Cite this
}
Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. / Berden, G.; Jamison, S. P.; MacLeod, Allan M.; Gillespie, W. Allan; Redlich, B.; van der Meer, A. F. G.
In: Physical Review Letters, Vol. 93, No. 11, 114802, 09.2004.Research output: Contribution to journal › Article
TY - JOUR
T1 - Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles
AU - Berden, G.
AU - Jamison, S. P.
AU - MacLeod, Allan M.
AU - Gillespie, W. Allan
AU - Redlich, B.
AU - van der Meer, A. F. G.
PY - 2004/9
Y1 - 2004/9
N2 - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.
AB - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.
U2 - 10.1103/PhysRevLett.93.114802
DO - 10.1103/PhysRevLett.93.114802
M3 - Article
VL - 93
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 11
M1 - 114802
ER -