Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden, S. P. Jamison, Allan M. MacLeod, W. Allan Gillespie, B. Redlich, A. F. G. van der Meer

Research output: Contribution to journalArticle

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Abstract

Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.
Original languageEnglish
Article number 114802
JournalPhysical Review Letters
Volume93
Issue number11
DOIs
Publication statusPublished - Sep 2004

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electro-optics
shot
profiles
electrons
pulses
cross correlation
time measurement

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Berden, G. ; Jamison, S. P. ; MacLeod, Allan M. ; Gillespie, W. Allan ; Redlich, B. ; van der Meer, A. F. G. / Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. In: Physical Review Letters. 2004 ; Vol. 93, No. 11.
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Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. / Berden, G.; Jamison, S. P.; MacLeod, Allan M.; Gillespie, W. Allan; Redlich, B.; van der Meer, A. F. G.

In: Physical Review Letters, Vol. 93, No. 11, 114802, 09.2004.

Research output: Contribution to journalArticle

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AU - Berden, G.

AU - Jamison, S. P.

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AU - Redlich, B.

AU - van der Meer, A. F. G.

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AB - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275  fs rms) long bunches.

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