Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden; S. P. Jamison; Allan M. MacLeod; W. Allan Gillespie; B. Redlich; A. F. G. van der Meer

doi:10.1103/PhysRevLett.93.114802

Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden, S. P. Jamison, Allan M. MacLeod, W. Allan Gillespie, B. Redlich, A. F. G. van der Meer

Research output: Contribution to journal › Article › peer-review

179 Citations (Scopus)

Abstract

Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.

Original language	English
Article number	114802
Journal	Physical Review Letters
Volume	93
Issue number	11
DOIs	https://doi.org/10.1103/PhysRevLett.93.114802
Publication status	Published - Sept 2004

Keywords

Electron beams

Access to Document

10.1103/PhysRevLett.93.114802

Cite this

@article{26e5a5e77e8e4ab6860591dd342fe91e,

title = "Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles",

abstract = "Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.",

author = "G. Berden and Jamison, \{S. P.\} and MacLeod, \{Allan M.\} and Gillespie, \{W. Allan\} and B. Redlich and \{van der Meer\}, \{A. F. G.\}",

year = "2004",

month = sep,

doi = "10.1103/PhysRevLett.93.114802",

language = "English",

volume = "93",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "11",

}

TY - JOUR

T1 - Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

AU - Berden, G.

AU - Jamison, S. P.

AU - MacLeod, Allan M.

AU - Gillespie, W. Allan

AU - Redlich, B.

AU - van der Meer, A. F. G.

PY - 2004/9

Y1 - 2004/9

N2 - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.

AB - Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.

U2 - 10.1103/PhysRevLett.93.114802

DO - 10.1103/PhysRevLett.93.114802

M3 - Article

SN - 0031-9007

VL - 93

JO - Physical Review Letters

JF - Physical Review Letters

IS - 11

M1 - 114802

ER -

Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

Abstract

Keywords

Access to Document

Fingerprint

Cite this