Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden; A. F. G. van der Meer; S. P. Jamison; B. Steffen; B. Schmidt; P. Schmüser; Allan M. MacLeod; W. Allan Gillespie; P. J. Phillips

Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden, A. F. G. van der Meer, S. P. Jamison, B. Steffen, B. Schmidt, P. Schmüser, Allan M. MacLeod, W. Allan Gillespie, P. J. Phillips

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

32 Downloads (Pure)

Abstract

Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

Original language	English
Title of host publication	Proceedings of the 30th International Free Electron Laser Conference
Subtitle of host publication	FEL08, Gyeongju, 24-29 August 2009
Pages	413-416
Number of pages	4
Publication status	Published - 2008
Event	30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of Duration: 24 Aug 2008 → 29 Aug 2008 Conference number: 30

Conference

Conference	30th International Free Electron Laser Conference
Abbreviated title	FEL 2008
Country	Korea, Republic of
City	Gyeongju
Period	24/08/08 → 29/08/08

Access to Document

MacLeod_Electro-opticTechniquesForLongitudinalElectron_Published_2008Final published version, 257 KB

http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf

Cite this

Berden, G., van der Meer, A. F. G., Jamison, S. P., Steffen, B., Schmidt, B., Schmüser, P., MacLeod, A. M., Gillespie, W. A., & Phillips, P. J. (2008). Electro-optic techniques for longitudinal electron bunch diagnostics. In Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009 (pp. 413-416) http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf

@inproceedings{00d63b4471a54581b2f5b74cb89bb798,

title = "Electro-optic techniques for longitudinal electron bunch diagnostics",

abstract = "Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.",

author = "G. Berden and {van der Meer}, {A. F. G.} and Jamison, {S. P.} and B. Steffen and B. Schmidt and P. Schm{\"u}ser and MacLeod, {Allan M.} and Gillespie, {W. Allan} and Phillips, {P. J.}",

year = "2008",

language = "English",

pages = "413--416",

booktitle = "Proceedings of the 30th International Free Electron Laser Conference",

note = "30th International Free Electron Laser Conference, FEL 2008 ; Conference date: 24-08-2008 Through 29-08-2008",

}

Berden, G, van der Meer, AFG, Jamison, SP, Steffen, B, Schmidt, B, Schmüser, P, MacLeod, AM, Gillespie, WA & Phillips, PJ 2008, Electro-optic techniques for longitudinal electron bunch diagnostics. in Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. pp. 413-416, 30th International Free Electron Laser Conference, Gyeongju, Korea, Republic of, 24/08/08. <http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf>

Electro-optic techniques for longitudinal electron bunch diagnostics. / Berden, G.; van der Meer, A. F. G.; Jamison, S. P.; Steffen, B.; Schmidt, B.; Schmüser, P.; MacLeod, Allan M.; Gillespie, W. Allan; Phillips, P. J.

Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. 2008. p. 413-416.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Electro-optic techniques for longitudinal electron bunch diagnostics

AU - Berden, G.

AU - van der Meer, A. F. G.

AU - Jamison, S. P.

AU - Steffen, B.

AU - Schmidt, B.

AU - Schmüser, P.

AU - MacLeod, Allan M.

AU - Gillespie, W. Allan

AU - Phillips, P. J.

N1 - Conference code: 30

PY - 2008

Y1 - 2008

N2 - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

AB - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

M3 - Conference contribution

SP - 413

EP - 416

BT - Proceedings of the 30th International Free Electron Laser Conference

T2 - 30th International Free Electron Laser Conference

Y2 - 24 August 2008 through 29 August 2008

ER -

Electro-optic techniques for longitudinal electron bunch diagnostics

Abstract

Conference

Access to Document

Fingerprint

Cite this