Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden, A. F. G. van der Meer, S. P. Jamison, B. Steffen, B. Schmidt, P. Schmüser, Allan M. MacLeod, W. Allan Gillespie, P. J. Phillips

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
Original languageEnglish
Title of host publicationProceedings of the 30th International Free Electron Laser Conference
Subtitle of host publicationFEL08, Gyeongju, 24-29 August 2009
Pages413-416
Number of pages4
StatePublished - 2008
Event30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of

Conference

Conference30th International Free Electron Laser Conference
Abbreviated titleFEL 2008
CountryKorea, Republic of
CityGyeongju
Period24/08/0829/08/08

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electro-optics
profiles
electrons
nonintrusive measurement
shot
accelerators
magnets
electric fields
pulses

Cite this

Berden, G., van der Meer, A. F. G., Jamison, S. P., Steffen, B., Schmidt, B., Schmüser, P., ... Phillips, P. J. (2008). Electro-optic techniques for longitudinal electron bunch diagnostics. In Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009 (pp. 413-416)

Berden, G.; van der Meer, A. F. G.; Jamison, S. P.; Steffen, B.; Schmidt, B.; Schmüser, P.; MacLeod, Allan M.; Gillespie, W. Allan; Phillips, P. J. / Electro-optic techniques for longitudinal electron bunch diagnostics.

Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. 2008. p. 413-416.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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title = "Electro-optic techniques for longitudinal electron bunch diagnostics",
abstract = "Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.",
author = "G. Berden and {van der Meer}, {A. F. G.} and Jamison, {S. P.} and B. Steffen and B. Schmidt and P. Schmüser and MacLeod, {Allan M.} and Gillespie, {W. Allan} and Phillips, {P. J.}",
year = "2008",
pages = "413--416",
booktitle = "Proceedings of the 30th International Free Electron Laser Conference",

}

Berden, G, van der Meer, AFG, Jamison, SP, Steffen, B, Schmidt, B, Schmüser, P, MacLeod, AM, Gillespie, WA & Phillips, PJ 2008, Electro-optic techniques for longitudinal electron bunch diagnostics. in Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. pp. 413-416, 30th International Free Electron Laser Conference, Gyeongju, Korea, Republic of, 24-29 August.

Electro-optic techniques for longitudinal electron bunch diagnostics. / Berden, G.; van der Meer, A. F. G.; Jamison, S. P.; Steffen, B.; Schmidt, B.; Schmüser, P.; MacLeod, Allan M.; Gillespie, W. Allan; Phillips, P. J.

Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. 2008. p. 413-416.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - CHAP

T1 - Electro-optic techniques for longitudinal electron bunch diagnostics

AU - Berden,G.

AU - van der Meer,A. F. G.

AU - Jamison,S. P.

AU - Steffen,B.

AU - Schmidt,B.

AU - Schmüser,P.

AU - MacLeod,Allan M.

AU - Gillespie,W. Allan

AU - Phillips,P. J.

PY - 2008

Y1 - 2008

N2 - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

AB - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

M3 - Conference contribution

SP - 413

EP - 416

BT - Proceedings of the 30th International Free Electron Laser Conference

ER -

Berden G, van der Meer AFG, Jamison SP, Steffen B, Schmidt B, Schmüser P et al. Electro-optic techniques for longitudinal electron bunch diagnostics. In Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. 2008. p. 413-416.