Abstract
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 30th International Free Electron Laser Conference |
| Subtitle of host publication | FEL08, Gyeongju, 24-29 August 2009 |
| Pages | 413-416 |
| Number of pages | 4 |
| Publication status | Published - 2008 |
| Event | 30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of Duration: 24 Aug 2008 → 29 Aug 2008 Conference number: 30 |
Conference
| Conference | 30th International Free Electron Laser Conference |
|---|---|
| Abbreviated title | FEL 2008 |
| Country | Korea, Republic of |
| City | Gyeongju |
| Period | 24/08/08 → 29/08/08 |
Fingerprint
Cite this
}
Electro-optic techniques for longitudinal electron bunch diagnostics. / Berden, G.; van der Meer, A. F. G.; Jamison, S. P.; Steffen, B.; Schmidt, B.; Schmüser, P.; MacLeod, Allan M.; Gillespie, W. Allan; Phillips, P. J.
Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. 2008. p. 413-416.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Electro-optic techniques for longitudinal electron bunch diagnostics
AU - Berden, G.
AU - van der Meer, A. F. G.
AU - Jamison, S. P.
AU - Steffen, B.
AU - Schmidt, B.
AU - Schmüser, P.
AU - MacLeod, Allan M.
AU - Gillespie, W. Allan
AU - Phillips, P. J.
PY - 2008
Y1 - 2008
N2 - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
AB - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
M3 - Conference contribution
SP - 413
EP - 416
BT - Proceedings of the 30th International Free Electron Laser Conference
ER -