Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden, A. F. G. van der Meer, S. P. Jamison, B. Steffen, B. Schmidt, P. Schmüser, Allan M. MacLeod, W. Allan Gillespie, P. J. Phillips

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
    Original languageEnglish
    Title of host publicationProceedings of the 30th International Free Electron Laser Conference
    Subtitle of host publicationFEL08, Gyeongju, 24-29 August 2009
    Number of pages4
    Publication statusPublished - 2008
    Event30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of
    Duration: 24 Aug 200829 Aug 2008
    Conference number: 30


    Conference30th International Free Electron Laser Conference
    Abbreviated titleFEL 2008
    Country/TerritoryKorea, Republic of


    • Electro-optic
    • Electron bunch diagnostics


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