Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden, A. F. G. van der Meer, S. P. Jamison, B. Steffen, B. Schmidt, P. Schmüser, Allan M. MacLeod, W. Allan Gillespie, P. J. Phillips

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Abstract

Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
Original languageEnglish
Title of host publicationProceedings of the 30th International Free Electron Laser Conference
Subtitle of host publicationFEL08, Gyeongju, 24-29 August 2009
Pages413-416
Number of pages4
Publication statusPublished - 2008
Event30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of
Duration: 24 Aug 200829 Aug 2008
Conference number: 30

Conference

Conference30th International Free Electron Laser Conference
Abbreviated titleFEL 2008
CountryKorea, Republic of
CityGyeongju
Period24/08/0829/08/08

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    Berden, G., van der Meer, A. F. G., Jamison, S. P., Steffen, B., Schmidt, B., Schmüser, P., MacLeod, A. M., Gillespie, W. A., & Phillips, P. J. (2008). Electro-optic techniques for longitudinal electron bunch diagnostics. In Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009 (pp. 413-416) http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf