Abstract
Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
Original language | English |
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Title of host publication | Proceedings of the 30th International Free Electron Laser Conference |
Subtitle of host publication | FEL08, Gyeongju, 24-29 August 2009 |
Pages | 413-416 |
Number of pages | 4 |
Publication status | Published - 2008 |
Event | 30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of Duration: 24 Aug 2008 → 29 Aug 2008 Conference number: 30 |
Conference
Conference | 30th International Free Electron Laser Conference |
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Abbreviated title | FEL 2008 |
Country/Territory | Korea, Republic of |
City | Gyeongju |
Period | 24/08/08 → 29/08/08 |
Keywords
- Electro-optic
- Electron bunch diagnostics