Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden; A. F. G. van der Meer; S. P. Jamison; B. Steffen; B. Schmidt; P. Schmüser; Allan M. MacLeod; W. Allan Gillespie; P. J. Phillips

Electro-optic techniques for longitudinal electron bunch diagnostics

G. Berden
, A. F. G. van der Meer
, S. P. Jamison
, B. Steffen
, B. Schmidt
, P. Schmüser
, Allan M. MacLeod
, W. Allan Gillespie
, P. J. Phillips

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Abstract

Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

Original language	English
Title of host publication	Proceedings of the 30th International Free Electron Laser Conference
Subtitle of host publication	FEL08, Gyeongju, 24-29 August 2009
Pages	413-416
Number of pages	4
Publication status	Published - 2008
Event	30th International Free Electron Laser Conference - Gyeongju, Korea, Republic of Duration: 24 Aug 2008 → 29 Aug 2008 Conference number: 30

Conference

Conference	30th International Free Electron Laser Conference
Abbreviated title	FEL 2008
Country/Territory	Korea, Republic of
City	Gyeongju
Period	24/08/08 → 29/08/08

Keywords

Electro-optic
Electron bunch diagnostics

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http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf

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Berden, G., van der Meer, A. F. G., Jamison, S. P., Steffen, B., Schmidt, B., Schmüser, P., MacLeod, A. M., Gillespie, W. A., & Phillips, P. J. (2008). Electro-optic techniques for longitudinal electron bunch diagnostics. In Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009 (pp. 413-416) http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf

@inproceedings{00d63b4471a54581b2f5b74cb89bb798,

title = "Electro-optic techniques for longitudinal electron bunch diagnostics",

abstract = "Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.",

author = "G. Berden and \{van der Meer\}, \{A. F. G.\} and Jamison, \{S. P.\} and B. Steffen and B. Schmidt and P. Schm{\"u}ser and MacLeod, \{Allan M.\} and Gillespie, \{W. Allan\} and Phillips, \{P. J.\}",

year = "2008",

language = "English",

pages = "413--416",

booktitle = "Proceedings of the 30th International Free Electron Laser Conference",

note = "30th International Free Electron Laser Conference, FEL 2008 ; Conference date: 24-08-2008 Through 29-08-2008",

}

Berden, G, van der Meer, AFG, Jamison, SP, Steffen, B, Schmidt, B, Schmüser, P, MacLeod, AM, Gillespie, WA & Phillips, PJ 2008, Electro-optic techniques for longitudinal electron bunch diagnostics. in Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009. pp. 413-416, 30th International Free Electron Laser Conference, Gyeongju, Korea, Republic of, 24/08/08. <http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf>

TY - GEN

T1 - Electro-optic techniques for longitudinal electron bunch diagnostics

AU - Berden, G.

AU - van der Meer, A. F. G.

AU - Jamison, S. P.

AU - Steffen, B.

AU - Schmidt, B.

AU - Schmüser, P.

AU - MacLeod, Allan M.

AU - Gillespie, W. Allan

AU - Phillips, P. J.

N1 - Conference code: 30

PY - 2008

Y1 - 2008

N2 - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

AB - Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.

M3 - Conference contribution

SP - 413

EP - 416

BT - Proceedings of the 30th International Free Electron Laser Conference

T2 - 30th International Free Electron Laser Conference

Y2 - 24 August 2008 through 29 August 2008

ER -

Electro-optic techniques for longitudinal electron bunch diagnostics

Abstract

Conference

Keywords

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