Precise measurements of the temporal proﬁle of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time proﬁle of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deﬂecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.
|Number of pages||16|
|Journal||Physical Review Special Topics Accelerators and Beams|
|Publication status||Published - Mar 2009|
Steffen, B., Arsov, V., Berden, G., Gillespie, W. A., Jamison, S. P., MacLeod, A. M., van der Meer, A. F. G., Phillips, P. J., Schlarb, H., Schmidt, B., & Schmüser, P. (2009). Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. Physical Review Special Topics Accelerators and Beams, 12(3), . https://doi.org/10.1103/PhysRevSTAB.12.032802