Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

B. Steffen; V. Arsov; G. Berden; W. A. Gillespie; S. P. Jamison; A. M. MacLeod; A. F. G. van der Meer; P. J. Phillips; H. Schlarb; B. Schmidt; P. Schmüser

doi:10.1103/PhysRevSTAB.12.032802

Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

B. Steffen
, V. Arsov
, G. Berden
, W. A. Gillespie
, S. P. Jamison
, A. M. MacLeod
, A. F. G. van der Meer
, P. J. Phillips
, H. Schlarb
, B. Schmidt
, P. Schmüser

Research output: Contribution to journal › Article › peer-review

101 Citations (Scopus)

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Abstract

Precise measurements of the temporal proﬁle of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time proﬁle of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deﬂecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

Original language	English
Article number	032802
Number of pages	16
Journal	Physical Review Special Topics Accelerators and Beams
Volume	12
Issue number	3
DOIs	https://doi.org/10.1103/PhysRevSTAB.12.032802
Publication status	Published - Mar 2009

Keywords

Electro-optic
Electron bunch length monitor

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Steffen, B., Arsov, V., Berden, G., Gillespie, W. A., Jamison, S. P., MacLeod, A. M., van der Meer, A. F. G., Phillips, P. J., Schlarb, H., Schmidt, B., & Schmüser, P. (2009). Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. Physical Review Special Topics Accelerators and Beams, 12(3), Article 032802. https://doi.org/10.1103/PhysRevSTAB.12.032802

@article{d3acd74374c54e3da7b2c70fd84e80ff,

title = "Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH",

abstract = "Precise measurements of the temporal proﬁle of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time proﬁle of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deﬂecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.",

author = "B. Steffen and V. Arsov and G. Berden and Gillespie, \{W. A.\} and Jamison, \{S. P.\} and MacLeod, \{A. M.\} and \{van der Meer\}, \{A. F. G.\} and Phillips, \{P. J.\} and H. Schlarb and B. Schmidt and P. Schm{\"u}ser",

year = "2009",

month = mar,

doi = "10.1103/PhysRevSTAB.12.032802",

language = "English",

volume = "12",

journal = "Physical Review Special Topics Accelerators and Beams",

issn = "1098-4402",

publisher = "American Physical Society",

number = "3",

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Steffen, B, Arsov, V, Berden, G, Gillespie, WA, Jamison, SP, MacLeod, AM, van der Meer, AFG, Phillips, PJ, Schlarb, H, Schmidt, B & Schmüser, P 2009, 'Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH', Physical Review Special Topics Accelerators and Beams, vol. 12, no. 3, 032802. https://doi.org/10.1103/PhysRevSTAB.12.032802

TY - JOUR

T1 - Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

AU - Steffen, B.

AU - Arsov, V.

AU - Berden, G.

AU - Gillespie, W. A.

AU - Jamison, S. P.

AU - MacLeod, A. M.

AU - van der Meer, A. F. G.

AU - Phillips, P. J.

AU - Schlarb, H.

AU - Schmidt, B.

AU - Schmüser, P.

PY - 2009/3

Y1 - 2009/3

N2 - Precise measurements of the temporal proﬁle of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time proﬁle of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deﬂecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

AB - Precise measurements of the temporal proﬁle of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time proﬁle of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deﬂecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

U2 - 10.1103/PhysRevSTAB.12.032802

DO - 10.1103/PhysRevSTAB.12.032802

M3 - Article

SN - 1098-4402

VL - 12

JO - Physical Review Special Topics Accelerators and Beams

JF - Physical Review Special Topics Accelerators and Beams

IS - 3

M1 - 032802

ER -

Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

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