Abstract
A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-xNx:H films (x ≤ 20 at.%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 × 1019-1.6 × 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the ID/IG ratio and a narrowing of the D-peak.
Original language | English |
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Pages (from-to) | 907-911 |
Number of pages | 5 |
Journal | Journal of Non-Crystalline Solids |
Volume | 299-302 |
Issue number | PART 2 |
DOIs | |
Publication status | Published - Apr 2002 |
Externally published | Yes |