Electronic properties of amorphous carbon nitride a-C1-xNx: H films investigated using vibrational and ESR characterisations

M. Lacerda*, M. Lejeune, B. J. Jones, R. C. Barklie, R. Bouzerar, K. Zellama, N. M.J. Conway, C. Godet

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-xNx:H films (x ≤ 20 at.%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 × 1019-1.6 × 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the ID/IG ratio and a narrowing of the D-peak.

Original languageEnglish
Pages (from-to)907-911
Number of pages5
JournalJournal of Non-Crystalline Solids
Issue numberPART 2
Publication statusPublished - Apr 2002
Externally publishedYes


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