Electronic properties of amorphous carbon nitride a-C1-xNx

H films investigated using vibrational and ESR characterisations

M. Lacerda*, M. Lejeune, B. J. Jones, R. C. Barklie, R. Bouzerar, K. Zellama, N. M.J. Conway, C. Godet

*Corresponding author for this work

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-xNx:H films (x ≤ 20 at.%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 × 1019-1.6 × 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the ID/IG ratio and a narrowing of the D-peak.

Original languageEnglish
Pages (from-to)907-911
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume299-302
Issue numberPART 2
DOIs
Publication statusPublished - Apr 2002
Externally publishedYes

Fingerprint

carbon nitrides
Carbon nitride
Amorphous carbon
Electronic properties
Paramagnetic resonance
Raman spectroscopy
Electron spin resonance spectroscopy
electronics
Nanostructures
electron paramagnetic resonance
disorders
Decomposition
Plasmas
decomposition
spectroscopy
excitation
cyanogen

Cite this

Lacerda, M. ; Lejeune, M. ; Jones, B. J. ; Barklie, R. C. ; Bouzerar, R. ; Zellama, K. ; Conway, N. M.J. ; Godet, C. / Electronic properties of amorphous carbon nitride a-C1-xNx : H films investigated using vibrational and ESR characterisations. In: Journal of Non-Crystalline Solids. 2002 ; Vol. 299-302, No. PART 2. pp. 907-911.
@article{1901f6f552df415ca963186a749326f2,
title = "Electronic properties of amorphous carbon nitride a-C1-xNx: H films investigated using vibrational and ESR characterisations",
abstract = "A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-xNx:H films (x ≤ 20 at.{\%}), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 × 1019-1.6 × 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the ID/IG ratio and a narrowing of the D-peak.",
author = "M. Lacerda and M. Lejeune and Jones, {B. J.} and Barklie, {R. C.} and R. Bouzerar and K. Zellama and Conway, {N. M.J.} and C. Godet",
year = "2002",
month = "4",
doi = "10.1016/S0022-3093(01)00990-5",
language = "English",
volume = "299-302",
pages = "907--911",
journal = "Journal of Non-Crystalline Solids",
issn = "0022-3093",
publisher = "Elsevier",
number = "PART 2",

}

Electronic properties of amorphous carbon nitride a-C1-xNx : H films investigated using vibrational and ESR characterisations. / Lacerda, M.; Lejeune, M.; Jones, B. J.; Barklie, R. C.; Bouzerar, R.; Zellama, K.; Conway, N. M.J.; Godet, C.

In: Journal of Non-Crystalline Solids, Vol. 299-302, No. PART 2, 04.2002, p. 907-911.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Electronic properties of amorphous carbon nitride a-C1-xNx

T2 - H films investigated using vibrational and ESR characterisations

AU - Lacerda, M.

AU - Lejeune, M.

AU - Jones, B. J.

AU - Barklie, R. C.

AU - Bouzerar, R.

AU - Zellama, K.

AU - Conway, N. M.J.

AU - Godet, C.

PY - 2002/4

Y1 - 2002/4

N2 - A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-xNx:H films (x ≤ 20 at.%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 × 1019-1.6 × 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the ID/IG ratio and a narrowing of the D-peak.

AB - A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-xNx:H films (x ≤ 20 at.%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 × 1019-1.6 × 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the ID/IG ratio and a narrowing of the D-peak.

U2 - 10.1016/S0022-3093(01)00990-5

DO - 10.1016/S0022-3093(01)00990-5

M3 - Article

VL - 299-302

SP - 907

EP - 911

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

SN - 0022-3093

IS - PART 2

ER -