Abstract
Nanoscopic changes in the cell surface morphology of the
yeasts Saccharomyces cerevisiae (strain NCYC 1681) and
Schizosaccharomyces pombe (strain DVPB 1354), due to
their exposure to varying concentrations of hydrogen
peroxide (oxidative stress), were investigated using an
atomic force microscope (AFM). Increasing hydrogen
peroxide concentration led to a decrease in cell viabilities
and mean cell volumes, and an increase in the surface
roughness of the yeasts. In addition, AFM studies revealed
that oxidative stress caused cell compression in both S.
cerevisiae and Schiz. pombe cells and an increase in the number
of aged yeasts. These results confirmed the importance and
usefulness of AFM in investigating the morphology of
stressed microbial cells at the nanoscale. The results also
provided novel information on the relative oxidative stress
tolerance of S. cerevisiae and Schiz. pombe.
| Original language | English |
|---|---|
| Pages (from-to) | 547-555 |
| Number of pages | 9 |
| Journal | Korean Journal of Microbiology and Biotechnology |
| Volume | 19 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2009 |
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Canetta, E., Walker, G. M., & Adya, A. K. (2009). Nanoscopic morphological changes in yeast cell surfaces caused by oxidative stress: an atomic force microscopic study. Korean Journal of Microbiology and Biotechnology, 19(6), 547-555. https://doi.org/10.4014/jmb.0809.515