Nanoscopic morphological changes in yeast cell surfaces caused by oxidative stress: an atomic force microscopic study

Elisabetta Canetta, Graeme M. Walker, Ashok K. Adya

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    18 Citations (Scopus)

    Abstract

    Nanoscopic changes in the cell surface morphology of the yeasts Saccharomyces cerevisiae (strain NCYC 1681) and Schizosaccharomyces pombe (strain DVPB 1354), due to their exposure to varying concentrations of hydrogen peroxide (oxidative stress), were investigated using an atomic force microscope (AFM). Increasing hydrogen peroxide concentration led to a decrease in cell viabilities and mean cell volumes, and an increase in the surface roughness of the yeasts. In addition, AFM studies revealed that oxidative stress caused cell compression in both S. cerevisiae and Schiz. pombe cells and an increase in the number of aged yeasts. These results confirmed the importance and usefulness of AFM in investigating the morphology of stressed microbial cells at the nanoscale. The results also provided novel information on the relative oxidative stress tolerance of S. cerevisiae and Schiz. pombe.
    Original languageEnglish
    Pages (from-to)547-555
    Number of pages9
    JournalKorean Journal of Microbiology and Biotechnology
    Volume19
    Issue number6
    Early online date14 Jan 2009
    DOIs
    Publication statusPublished - 28 Jun 2009

    Keywords

    • Saccharomyces cerevisiae
    • Schizosaccharomyces pombe
    • Premature ageing of cells
    • Atomic force microscopy (AFM)
    • Yeast morphology
    • Yeasts physiology
    • Oxidative stress

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