Quality and reliability metrics for IoT systems: a consolidated view

Matej Klima; Vaclav Rechtberger; Miroslav Bures; Xavier Bellekens; Hanan Hindy; Bestoun S. Ahmed

doi:10.1007/978-3-030-76063-2_42

Quality and reliability metrics for IoT systems: a consolidated view

Matej Klima, Vaclav Rechtberger, Miroslav Bures^*, Xavier Bellekens, Hanan Hindy, Bestoun S. Ahmed

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Citations (Scopus)

761 Downloads (Pure)

Abstract

Quality and reliability metrics play an important role in the evaluation of the state of a system during the development and testing phases, and serve as tools to optimize the testing process or to define the exit or acceptance criteria of the system. This study provides a consolidated view on the available quality and reliability metrics applicable to Internet of Things (IoT) systems, as no comprehensive study has provided such a view specific to these systems. The quality and reliability metrics categorized and discussed in this paper are divided into three categories: metrics assessing the quality of an IoT system or service, metrics for assessing the effectiveness of the testing process, and metrics that can be universally applied in both cases. In the discussion, recommendations of proper usage of discussed metrics in a testing process are then given.

Original language	English
Title of host publication	Science and technologies for smart cities
Subtitle of host publication	6th EAI International Conference, SmartCity360°, virtual event, December 2-4, 2020 : proceedings
Editors	Sara Paiva, Sérgio Ivan Lopes, Rafik Zitouni, Nishu Gupta, Sérgio F. Lopes, Takuro Yonezawa
Place of Publication	Cham
Publisher	Springer
Pages	635-650
Number of pages	16
ISBN (Electronic)	9783030760632
ISBN (Print)	9783030760625
DOIs	https://doi.org/10.1007/978-3-030-76063-2_42
Publication status	Published - 22 May 2021
Event	6th EAI International Convention on Science and Technologies for Smart Cities - online conference Duration: 2 Dec 2020 → 4 Dec 2020 https://smartcity360.eai-conferences.org/2020/

Publication series

Name	Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST)
Publisher	Springer
Volume	372
ISSN (Print)	1867-8211
ISSN (Electronic)	1867-822X

Conference

Conference	6th EAI International Convention on Science and Technologies for Smart Cities
Abbreviated title	SmartCity360°
Period	2/12/20 → 4/12/20
Internet address	https://smartcity360.eai-conferences.org/2020/

Keywords

Internet of Things
IoT
Quality
Metrics
Testing
Reliability
Verification

Access to Document

10.1007/978-3-030-76063-2_42

Hindy_QualityAndReliabilityMetricsForIoT_Accepted_2020Accepted author manuscript, 378 KB

Cite this

Klima, M., Rechtberger, V., Bures, M., Bellekens, X., Hindy, H., & Ahmed, B. S. (2021). Quality and reliability metrics for IoT systems: a consolidated view. In S. Paiva, S. I. Lopes, R. Zitouni, N. Gupta, S. F. Lopes, & T. Yonezawa (Eds.), Science and technologies for smart cities: 6th EAI International Conference, SmartCity360°, virtual event, December 2-4, 2020 : proceedings (pp. 635-650). (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST); Vol. 372). Springer. https://doi.org/10.1007/978-3-030-76063-2_42

Klima, Matej ; Rechtberger, Vaclav ; Bures, Miroslav et al. / Quality and reliability metrics for IoT systems : a consolidated view. Science and technologies for smart cities: 6th EAI International Conference, SmartCity360°, virtual event, December 2-4, 2020 : proceedings. editor / Sara Paiva ; Sérgio Ivan Lopes ; Rafik Zitouni ; Nishu Gupta ; Sérgio F. Lopes ; Takuro Yonezawa. Cham : Springer, 2021. pp. 635-650 (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST)).

@inproceedings{1e539ca9a4a949e1aceb3ac6d7764ce1,

title = "Quality and reliability metrics for IoT systems: a consolidated view",

abstract = "Quality and reliability metrics play an important role in the evaluation of the state of a system during the development and testing phases, and serve as tools to optimize the testing process or to define the exit or acceptance criteria of the system. This study provides a consolidated view on the available quality and reliability metrics applicable to Internet of Things (IoT) systems, as no comprehensive study has provided such a view specific to these systems. The quality and reliability metrics categorized and discussed in this paper are divided into three categories: metrics assessing the quality of an IoT system or service, metrics for assessing the effectiveness of the testing process, and metrics that can be universally applied in both cases. In the discussion, recommendations of proper usage of discussed metrics in a testing process are then given.",

author = "Matej Klima and Vaclav Rechtberger and Miroslav Bures and Xavier Bellekens and Hanan Hindy and Ahmed, \{Bestoun S.\}",

note = "{\textcopyright} 2021, ICST Institute for Computer Sciences, Social Informatics and Telecommunications Engineering. Data availability statement: Not present.; 6th EAI International Convention on Science and Technologies for Smart Cities, SmartCity360° ; Conference date: 02-12-2020 Through 04-12-2020",

year = "2021",

month = may,

day = "22",

doi = "10.1007/978-3-030-76063-2\_42",

language = "English",

isbn = "9783030760625",

series = "Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST)",

publisher = "Springer",

pages = "635--650",

editor = "Sara Paiva and Lopes, \{S{\'e}rgio Ivan\} and Rafik Zitouni and Nishu Gupta and Lopes, \{S{\'e}rgio F.\} and Takuro Yonezawa",

booktitle = "Science and technologies for smart cities",

url = "https://smartcity360.eai-conferences.org/2020/",

}

Klima, M, Rechtberger, V, Bures, M, Bellekens, X, Hindy, H & Ahmed, BS 2021, Quality and reliability metrics for IoT systems: a consolidated view. in S Paiva, SI Lopes, R Zitouni, N Gupta, SF Lopes & T Yonezawa (eds), Science and technologies for smart cities: 6th EAI International Conference, SmartCity360°, virtual event, December 2-4, 2020 : proceedings. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST), vol. 372, Springer, Cham, pp. 635-650, 6th EAI International Convention on Science and Technologies for Smart Cities, 2/12/20. https://doi.org/10.1007/978-3-030-76063-2_42

Quality and reliability metrics for IoT systems: a consolidated view. / Klima, Matej; Rechtberger, Vaclav; Bures, Miroslav et al.
Science and technologies for smart cities: 6th EAI International Conference, SmartCity360°, virtual event, December 2-4, 2020 : proceedings. ed. / Sara Paiva; Sérgio Ivan Lopes; Rafik Zitouni; Nishu Gupta; Sérgio F. Lopes; Takuro Yonezawa. Cham: Springer, 2021. p. 635-650 (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST); Vol. 372).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Quality and reliability metrics for IoT systems

T2 - 6th EAI International Convention on Science and Technologies for Smart Cities

AU - Klima, Matej

AU - Rechtberger, Vaclav

AU - Bures, Miroslav

AU - Bellekens, Xavier

AU - Hindy, Hanan

AU - Ahmed, Bestoun S.

PY - 2021/5/22

Y1 - 2021/5/22

N2 - Quality and reliability metrics play an important role in the evaluation of the state of a system during the development and testing phases, and serve as tools to optimize the testing process or to define the exit or acceptance criteria of the system. This study provides a consolidated view on the available quality and reliability metrics applicable to Internet of Things (IoT) systems, as no comprehensive study has provided such a view specific to these systems. The quality and reliability metrics categorized and discussed in this paper are divided into three categories: metrics assessing the quality of an IoT system or service, metrics for assessing the effectiveness of the testing process, and metrics that can be universally applied in both cases. In the discussion, recommendations of proper usage of discussed metrics in a testing process are then given.

AB - Quality and reliability metrics play an important role in the evaluation of the state of a system during the development and testing phases, and serve as tools to optimize the testing process or to define the exit or acceptance criteria of the system. This study provides a consolidated view on the available quality and reliability metrics applicable to Internet of Things (IoT) systems, as no comprehensive study has provided such a view specific to these systems. The quality and reliability metrics categorized and discussed in this paper are divided into three categories: metrics assessing the quality of an IoT system or service, metrics for assessing the effectiveness of the testing process, and metrics that can be universally applied in both cases. In the discussion, recommendations of proper usage of discussed metrics in a testing process are then given.

U2 - 10.1007/978-3-030-76063-2_42

DO - 10.1007/978-3-030-76063-2_42

M3 - Conference contribution

SN - 9783030760625

T3 - Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST)

SP - 635

EP - 650

BT - Science and technologies for smart cities

A2 - Paiva, Sara

A2 - Lopes, Sérgio Ivan

A2 - Zitouni, Rafik

A2 - Gupta, Nishu

A2 - Lopes, Sérgio F.

A2 - Yonezawa, Takuro

PB - Springer

CY - Cham

Y2 - 2 December 2020 through 4 December 2020

ER -

Klima M, Rechtberger V, Bures M, Bellekens X, Hindy H, Ahmed BS. Quality and reliability metrics for IoT systems: a consolidated view. In Paiva S, Lopes SI, Zitouni R, Gupta N, Lopes SF, Yonezawa T, editors, Science and technologies for smart cities: 6th EAI International Conference, SmartCity360°, virtual event, December 2-4, 2020 : proceedings. Cham: Springer. 2021. p. 635-650. (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering (LNICST)). Epub 2021 May 22. doi: 10.1007/978-3-030-76063-2_42

Quality and reliability metrics for IoT systems: a consolidated view

Abstract

Publication series

Conference

Keywords

Access to Document

Fingerprint

Cite this