Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation

B. Steffen; E. A. Knabbe; H. Schlarb; B. Schmidt; P. Schmüser; W. Allan Gillespie; P. J. Phillips; S. P. Jamison; G. Berden; A. F. G. van der Meer; Allan M. MacLeod

Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation

B. Steffen, E. A. Knabbe, H. Schlarb, B. Schmidt, P. Schmüser, W. Allan Gillespie, P. J. Phillips, S. P. Jamison, G. Berden, A. F. G. van der Meer, Allan M. MacLeod

Abertay University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Abstract

At the superconducting linac of FLASH at DESY, we have installed an electro-optic (EO) experiment for single- shot, non-destructive measurements of the longitudinal electric charge distribution of individual electron bunches. The time profile of the electric bunch field is electro- optically encoded onto a chirped titanium-sapphire laser pulse. In the decoding step, the profile is retrieved either from a cross-correlation of the encoded pulse with a 30 fs laser pulse, obtained from the same laser (electro- optic temporal decoding, EOTD), or from the spectral intensity of the transmitted probe pulse (electro-optic spectral decoding, EOSD). At FLASH, the longitudinally compressed electron bunches have been measured during FEL operation with a resolution of better than 50 fs. The electro-optic process in gallium phosphide was numerically simulated using as input data the bunch shapes determined with a transverse-deflecting RF structure. In this contribution, we present electro-optically measured bunch profiles and compare them with the simulation.

Original language	English
Title of host publication	Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007
Pages	310-313
Number of pages	4
Publication status	Published - 2007

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Steffen, B., Knabbe, E. A., Schlarb, H., Schmidt, B., Schmüser, P., Gillespie, W. A., Phillips, P. J., Jamison, S. P., Berden, G., van der Meer, A. F. G., & MacLeod, A. M. (2007). Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation. In Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007 (pp. 310-313) http://accelconf.web.cern.ch/AccelConf/f07/HTML/AUTHOR.HTM

Steffen, B. ; Knabbe, E. A. ; Schlarb, H. ; Schmidt, B. ; Schmüser, P. ; Gillespie, W. Allan ; Phillips, P. J. ; Jamison, S. P. ; Berden, G. ; van der Meer, A. F. G. ; MacLeod, Allan M. / Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection : experiment, simulation, and validation. Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007. 2007. pp. 310-313

@inproceedings{f76978fc3ee74632952a4ce4c031824f,

title = "Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation",

abstract = "At the superconducting linac of FLASH at DESY, we have installed an electro-optic (EO) experiment for single- shot, non-destructive measurements of the longitudinal electric charge distribution of individual electron bunches. The time profile of the electric bunch field is electro- optically encoded onto a chirped titanium-sapphire laser pulse. In the decoding step, the profile is retrieved either from a cross-correlation of the encoded pulse with a 30 fs laser pulse, obtained from the same laser (electro- optic temporal decoding, EOTD), or from the spectral intensity of the transmitted probe pulse (electro-optic spectral decoding, EOSD). At FLASH, the longitudinally compressed electron bunches have been measured during FEL operation with a resolution of better than 50 fs. The electro-optic process in gallium phosphide was numerically simulated using as input data the bunch shapes determined with a transverse-deflecting RF structure. In this contribution, we present electro-optically measured bunch profiles and compare them with the simulation.",

author = "B. Steffen and Knabbe, {E. A.} and H. Schlarb and B. Schmidt and P. Schm{\"u}ser and Gillespie, {W. Allan} and Phillips, {P. J.} and Jamison, {S. P.} and G. Berden and {van der Meer}, {A. F. G.} and MacLeod, {Allan M.}",

year = "2007",

language = "English",

pages = "310--313",

booktitle = "Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007",

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Steffen, B, Knabbe, EA, Schlarb, H, Schmidt, B, Schmüser, P, Gillespie, WA, Phillips, PJ, Jamison, SP, Berden, G, van der Meer, AFG & MacLeod, AM 2007, Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation. in Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007. pp. 310-313. <http://accelconf.web.cern.ch/AccelConf/f07/HTML/AUTHOR.HTM>

Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection : experiment, simulation, and validation. / Steffen, B.; Knabbe, E. A.; Schlarb, H.; Schmidt, B.; Schmüser, P.; Gillespie, W. Allan; Phillips, P. J.; Jamison, S. P.; Berden, G.; van der Meer, A. F. G.; MacLeod, Allan M.

Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007. 2007. p. 310-313.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection

T2 - experiment, simulation, and validation

AU - Steffen, B.

AU - Knabbe, E. A.

AU - Schlarb, H.

AU - Schmidt, B.

AU - Schmüser, P.

AU - Gillespie, W. Allan

AU - Phillips, P. J.

AU - Jamison, S. P.

AU - Berden, G.

AU - van der Meer, A. F. G.

AU - MacLeod, Allan M.

PY - 2007

Y1 - 2007

N2 - At the superconducting linac of FLASH at DESY, we have installed an electro-optic (EO) experiment for single- shot, non-destructive measurements of the longitudinal electric charge distribution of individual electron bunches. The time profile of the electric bunch field is electro- optically encoded onto a chirped titanium-sapphire laser pulse. In the decoding step, the profile is retrieved either from a cross-correlation of the encoded pulse with a 30 fs laser pulse, obtained from the same laser (electro- optic temporal decoding, EOTD), or from the spectral intensity of the transmitted probe pulse (electro-optic spectral decoding, EOSD). At FLASH, the longitudinally compressed electron bunches have been measured during FEL operation with a resolution of better than 50 fs. The electro-optic process in gallium phosphide was numerically simulated using as input data the bunch shapes determined with a transverse-deflecting RF structure. In this contribution, we present electro-optically measured bunch profiles and compare them with the simulation.

AB - At the superconducting linac of FLASH at DESY, we have installed an electro-optic (EO) experiment for single- shot, non-destructive measurements of the longitudinal electric charge distribution of individual electron bunches. The time profile of the electric bunch field is electro- optically encoded onto a chirped titanium-sapphire laser pulse. In the decoding step, the profile is retrieved either from a cross-correlation of the encoded pulse with a 30 fs laser pulse, obtained from the same laser (electro- optic temporal decoding, EOTD), or from the spectral intensity of the transmitted probe pulse (electro-optic spectral decoding, EOSD). At FLASH, the longitudinally compressed electron bunches have been measured during FEL operation with a resolution of better than 50 fs. The electro-optic process in gallium phosphide was numerically simulated using as input data the bunch shapes determined with a transverse-deflecting RF structure. In this contribution, we present electro-optically measured bunch profiles and compare them with the simulation.

M3 - Conference contribution

SP - 310

EP - 313

BT - Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk, August 26-31 2007

ER -