Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection

P. J. Phillips; W. Allan Gillespie; B. Steffen; E. A. Knabbe; B. Schmidt; P. Schmüser; S. P. Jamison; G. Berden; A. F. G. van der Meer; Allan M. MacLeod

Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection

P. J. Phillips, W. Allan Gillespie, B. Steffen, E. A. Knabbe, B. Schmidt, P. Schmüser, S. P. Jamison, G. Berden, A. F. G. van der Meer, Allan M. MacLeod

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

47 Downloads (Pure)

Abstract

For the high gain operation of a SASE FEL, extremely short electron bunches are essential to generate sufficiently high peak currents. At the superconducting linac of FLASH at DESY, we have installed an electro- optic measurement system to probe the time structure of the electric field of single ~100 fs electron bunches. In this technique, the field induced birefringence in an electro-optic crystal is encoded on a chirped picosecond laser pulse. The longitudinal electric field profile of the electron bunch is then obtained from the encoded optical pulse by a single shot cross correlation with a 35 fs laser pulse using a second harmonic crystal (temporal decoding). An electro-optical signal exhibiting a feature with 118 fs FWHM was observed, and this is close to the limit of resolution due to the material properties of the particular electro-optic crystal used. The measured electro-optic signals are compared to bunch shapes simultaneously measured with a transverse deflecting cavity.

Original language	English
Title of host publication	Proceedings of DIPAC 2007
Editors	Ivan Andrian, Volker R. W. Schaa
Publisher	DIPAC
Pages	221-223
Number of pages	3
Publication status	Published - 31 Oct 2008
Event	8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators - NH Laguna Palace, Venice, Italy Duration: 20 May 2007 → 23 May 2007 Conference number: 8 http://accelconf.web.cern.ch/AccelConf/d07/index.htm

Workshop

Workshop	8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators
Abbreviated title	DIPAC 2007
Country/Territory	Italy
City	Venice
Period	20/05/07 → 23/05/07
Internet address	http://accelconf.web.cern.ch/AccelConf/d07/index.htm

Keywords

Electro-optic
Electron bunch diagnostics

Access to Document

MacLeod_SingleShotLongitudinalBunchProfile_Published_2007Final published version, 381 KB

http://www.elettra.trieste.it/dipac07/uploads/Main/dipac07-proceedings.pdf

Cite this

Phillips, P. J., Gillespie, W. A., Steffen, B., Knabbe, E. A., Schmidt, B., Schmüser, P., Jamison, S. P., Berden, G., van der Meer, A. F. G., & MacLeod, A. M. (2008). Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection. In I. Andrian, & V. R. W. Schaa (Eds.), Proceedings of DIPAC 2007 (pp. 221-223). DIPAC. http://www.elettra.trieste.it/dipac07/uploads/Main/dipac07-proceedings.pdf

@inproceedings{a829f15d3aa4431eae631d948a7aca6d,

title = "Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection",

abstract = "For the high gain operation of a SASE FEL, extremely short electron bunches are essential to generate sufficiently high peak currents. At the superconducting linac of FLASH at DESY, we have installed an electro- optic measurement system to probe the time structure of the electric field of single ~100 fs electron bunches. In this technique, the field induced birefringence in an electro-optic crystal is encoded on a chirped picosecond laser pulse. The longitudinal electric field profile of the electron bunch is then obtained from the encoded optical pulse by a single shot cross correlation with a 35 fs laser pulse using a second harmonic crystal (temporal decoding). An electro-optical signal exhibiting a feature with 118 fs FWHM was observed, and this is close to the limit of resolution due to the material properties of the particular electro-optic crystal used. The measured electro-optic signals are compared to bunch shapes simultaneously measured with a transverse deflecting cavity.",

author = "Phillips, {P. J.} and Gillespie, {W. Allan} and B. Steffen and Knabbe, {E. A.} and B. Schmidt and P. Schm{\"u}ser and Jamison, {S. P.} and G. Berden and {van der Meer}, {A. F. G.} and MacLeod, {Allan M.}",

year = "2008",

month = oct,

day = "31",

language = "English",

pages = "221--223",

editor = "Ivan Andrian and Schaa, {Volker R. W.}",

booktitle = "Proceedings of DIPAC 2007",

publisher = "DIPAC",

note = "8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, DIPAC 2007 ; Conference date: 20-05-2007 Through 23-05-2007",

url = "http://accelconf.web.cern.ch/AccelConf/d07/index.htm",

}

Phillips, PJ, Gillespie, WA, Steffen, B, Knabbe, EA, Schmidt, B, Schmüser, P, Jamison, SP, Berden, G, van der Meer, AFG & MacLeod, AM 2008, Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection. in I Andrian & VRW Schaa (eds), Proceedings of DIPAC 2007. DIPAC, pp. 221-223, 8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, Venice, Italy, 20/05/07. <http://www.elettra.trieste.it/dipac07/uploads/Main/dipac07-proceedings.pdf>

TY - GEN

T1 - Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection

AU - Phillips, P. J.

AU - Gillespie, W. Allan

AU - Steffen, B.

AU - Knabbe, E. A.

AU - Schmidt, B.

AU - Schmüser, P.

AU - Jamison, S. P.

AU - Berden, G.

AU - van der Meer, A. F. G.

AU - MacLeod, Allan M.

N1 - Conference code: 8

PY - 2008/10/31

Y1 - 2008/10/31

N2 - For the high gain operation of a SASE FEL, extremely short electron bunches are essential to generate sufficiently high peak currents. At the superconducting linac of FLASH at DESY, we have installed an electro- optic measurement system to probe the time structure of the electric field of single ~100 fs electron bunches. In this technique, the field induced birefringence in an electro-optic crystal is encoded on a chirped picosecond laser pulse. The longitudinal electric field profile of the electron bunch is then obtained from the encoded optical pulse by a single shot cross correlation with a 35 fs laser pulse using a second harmonic crystal (temporal decoding). An electro-optical signal exhibiting a feature with 118 fs FWHM was observed, and this is close to the limit of resolution due to the material properties of the particular electro-optic crystal used. The measured electro-optic signals are compared to bunch shapes simultaneously measured with a transverse deflecting cavity.

AB - For the high gain operation of a SASE FEL, extremely short electron bunches are essential to generate sufficiently high peak currents. At the superconducting linac of FLASH at DESY, we have installed an electro- optic measurement system to probe the time structure of the electric field of single ~100 fs electron bunches. In this technique, the field induced birefringence in an electro-optic crystal is encoded on a chirped picosecond laser pulse. The longitudinal electric field profile of the electron bunch is then obtained from the encoded optical pulse by a single shot cross correlation with a 35 fs laser pulse using a second harmonic crystal (temporal decoding). An electro-optical signal exhibiting a feature with 118 fs FWHM was observed, and this is close to the limit of resolution due to the material properties of the particular electro-optic crystal used. The measured electro-optic signals are compared to bunch shapes simultaneously measured with a transverse deflecting cavity.

M3 - Conference contribution

SP - 221

EP - 223

BT - Proceedings of DIPAC 2007

A2 - Andrian, Ivan

A2 - Schaa, Volker R. W.

PB - DIPAC

T2 - 8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators

Y2 - 20 May 2007 through 23 May 2007

ER -

Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detection

Abstract

Workshop

Keywords

Access to Document

Fingerprint

Cite this